MURR,LAWRENCE E. <br/><br/>
Electron and Ion Microscopy and Microanalysis: Principles and applications 

 - 2nd ed. 
 - New York  MDI Dekker  1991 
 - 837p 
<br/><br/><label>ISBN: </label>0824785568 
<br/><br/><label>Dewey Class. No.: </label>681.7 MUR