000			00392nam a22001457a 4500
999			_c15763 _d15763
008			201222b ||||| |||| 00| 0 eng d
020			_a0824785568
082			_a681.7 MUR
100			_aMURR,LAWRENCE E.
245			_aElectron and Ion Microscopy and Microanalysis: Principles and applications
250			_a2nd ed.
260			_aNew York _bMDI Dekker _c1991
300			_a837p
942			_cBK