| 000 -LEADER |
|---|
| fixed length control field |
00392nam a22001457a 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
201222b ||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0824785568 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
681.7 MUR |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
MURR,LAWRENCE E. |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Electron and Ion Microscopy and Microanalysis: Principles and applications |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
2nd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc |
New York |
| Name of publisher, distributor, etc |
MDI Dekker |
| Date of publication, distribution, etc |
1991 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
837p |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Item type |
Books |
