Electron and Ion Microscopy and Microanalysis: Principles and applications
By: MURR,LAWRENCE E.
Material type:
BookPublisher: New York MDI Dekker 1991Edition: 2nd ed.Description: 837p.ISBN: 0824785568.DDC classification: 681.7 MUR
| Item type | Current location | Shelving location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
Books
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NIT Andhra | Reference | 681.7 MUR (Browse shelf) | Not For Loan | 18379 |
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